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Physical Principles of Electron Microscopy: an Introduction to TEM, SEM, and AEM /

Egerton, R.F.

Physical Principles of Electron Microscopy: an Introduction to TEM, SEM, and AEM / R.F. Egerton - 2nd ed. - Chennai : Springer , 2016.

ISBN: 9783319819860

Subjects--Topical Terms:
Materials Science

Dewey Class. No.: 502.828 / EGE

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Physical Principles of Electron Microscopy: an Introduction to TEM, SEM, and AEM /

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