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Advanced Transmission Electron Microscopy : imaging And Diffraction In Nanoscience / Jian Min , Zuo

By:

Zuo, Jian Min

Material type: Text

Text

TextPublication details: Springer; 2017.ISBN:

9781493966059

Subject(s):

scince

DDC classification:

502.825 ZUO

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Holdings ( 1 )

Holdings
Item type	Current library	Collection	Shelving location	Call number	Status	Barcode
Reference	Kalaignar Centenary Library Madurai	ENGLISH-REFERENCE BOOKS	மூன்றாம் தளம் / Third floor	502.825 ZUO (Browse shelf(Opens below))	Not for loan	287296

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Previous	502.825 MCV Electron Microscopy and Analysis 2003 /	502.825 MUR Electron And Ion Microscopy And Microanalysis	502.825 SPE High Resolution Elec Micro 4E C /	502.825 ZUO Advanced Transmission Electron Microscopy : imaging And Diffraction In Nanoscience /	502.828 EGE Physical Principles of Electron Microscopy: an Introduction to TEM, SEM, and AEM /	502.83 MEY Scanning Probe Microscopy, the Lab on a Tip /	502.84 HAV Laboratory Instrumentation, 4Th Edition /	Next

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