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Scanning Probe Microscopy, Atomic Force Microscopy And Scanning Tunneling Microscopy / Bert Voigtländer

By:

Voigtländer, Bert

Material type: Text

Text

TextPublication details: Springer , 2015.Edition: 1st edISBN:

9783662505571

Subject(s):

Materials Science

DDC classification:

502.82 VOI

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Holdings ( 1 )

Holdings
Item type	Current library	Collection	Shelving location	Call number	Status	Barcode
Reference	Kalaignar Centenary Library Madurai	ENGLISH-REFERENCE BOOKS	மூன்றாம் தளம் / Third floor	502.82 VOI (Browse shelf(Opens below))	Not for loan	315210

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Previous	502.82 SAN Atomic Force Microscopy Fundamental Concepts And Laboratory Investigations /	502.82 SCI Think Like a Scientist in the Kitchen /	502.82 TOM Scanning Probe Microscopy /	502.82 VOI Scanning Probe Microscopy, Atomic Force Microscopy And Scanning Tunneling Microscopy /	502.825 EGE Physical Principles Of Electron Microscopy: an Introduction To Tem, Sem, And Aem /	502.825 GOL Scanning Electron Microscopy And X Ray Microanalysis /	502.825 GOO Electron Microscopy And Analysis (3 Rd Ed)	Next

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