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Introduction to Quantum Metrology, the Revised Si System and Quantum Standards / Waldemar Nawrocki

By:

Nawrocki, Waldemar

Material type: Text

Text

TextPublication details: Springer , 2019Edition: 2nd editionISBN:

9783030196769

Subject(s):

Physics

DDC classification:

530.8 NAW

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Holdings ( 1 )

Holdings
Item type	Current library	Collection	Shelving location	Call number	Status	Date due	Barcode
Reference	Kalaignar Centenary Library Madurai	ENGLISH-REFERENCE BOOKS	மூன்றாம் தளம் / Third floor	530.8 NAW (Browse shelf(Opens below))	Not for loan		200698

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Previous	530.8 KIR An Introduction To Uncertainty In Measurement /	530.8 KYB Theory And Measurement /	530.8 LEM A Student'S Guide To Dimensional Analysis	530.8 NAW Introduction to Quantum Metrology, the Revised Si System and Quantum Standards /	530.8 NOL Jones’ Instrument Technology: Mechanical Measurements, 4E (Vol 1)	530.8 NOL Jones’ Instrument Technology: Automatic Instruments And Measuring Systems, 4E(Vol 5)	530.8 NOL Jones’ Instrument Technology: Instrumentations Systems, 4E(Vol 4)	Next

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