Voigtländer, Bert <br/><br/>
Scanning Probe Microscopy, Atomic Force Microscopy And Scanning Tunneling Microscopy / 
Bert Voigtländer 
 - 1st ed. 
 -  Springer ,  2015. 
<br/><br/><label>ISBN: </label>9783662505571 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials Science
<br/><br/><label>Dewey Class. No.: </label>502.82  / VOI