Egerton, Ray.F. <br/><br/>
Physical Principles Of Electron Microscopy: an Introduction To Tem, Sem, And Aem / 
Ray.F. Egerton 
 - 1st ed. 
 -  Springer,  2005. 
<br/><br/><label>ISBN: </label>9780387258003 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials Science
<br/><br/><label>Dewey Class. No.: </label>502.825  / EGE