Sun, Y. <br/><br/>
Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits The System On Chip Approach (Pb 2012) 
Sun Y. 
 - 1 
 -  Iet  2012 
<br/><br/><label>ISBN: </label>9780863417450 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical & Electronics Engineering
<br/><br/><label>Dewey Class. No.: </label>621.3815  / SUN