000 00472nam a2200157Ia 4500
005 20250505164818.0
008 230717s9999 xx 000 0 und d
020 _a9783662505571
_qpbk.
082 _a502.82
_bVOI
100 _aVoigtländer, Bert
245 0 _aScanning Probe Microscopy, Atomic Force Microscopy And Scanning Tunneling Microscopy /
_cBert Voigtländer
250 _a1st ed.
260 _bSpringer ,
_c2015.
650 _aMaterials Science
942 _cENG
999 _c157899
_d157899