000 00468nam a2200157Ia 4500
005 20250505183030.0
008 230702s9999 xx 000 0 und d
020 _a9783319819860
_qpbk.
082 _a502.828
_bEGE
100 _aEgerton, R.F.
245 0 _aPhysical Principles of Electron Microscopy: an Introduction to TEM, SEM, and AEM /
_cR.F. Egerton
250 _a2nd ed.
260 _aChennai :
_bSpringer ,
_c2016.
650 _aMaterials Science
942 _cENG
999 _c39928
_d39928