000 00415nam a2200145Ia 4500
008 230702s9999 xx 000 0 und d
020 _a9783030237837
_bpbk
082 _a621.3815
_bHAL
100 _aHalak, Basel
245 0 _aAgeing of Integrated Circuits, Causes, Effects and Mitigation Techniques /
_cBasel Halak
250 _a1st edition
260 _bSpringer ,
_c2020
650 _aEngineering
942 _cENG
999 _c54801
_d54801